Grain Size Analysis in Copper

In this example, Clemex Vision system is selected to measure the grain size of copper alloy with the presence of twined grains.

Grain size analysis in copper | Clemex

Figure 1. The microstructure of etched copper is viewed at 200X magnification. It is difficult to distinguish the twin boundaries from the real grain network. Therefore, an intercept method is applied in the current analysis.

Grain size analysis in copper | Clemex

Figure 2. Three concentric circles are placed as overlay over the field being analyzed.  With an automatic analysis including a pause for manual editing, the circles are disconnected at the specified intersections. Artifacts are eliminated prior to automatic measurements.


Demonstrate the ability of the Clemex Vision image analysis system can perform semi-automatic grain size measurements. The methods and operations used are discussed in the report linked at the bottom of this page (click the Download PDF link below).

Grain size analysis in copper | Clemex


ASTM E 112 grain size measurements are performed on each section using Heyn method. Automated statistics and graph are generated and cumulated over all analyzed fields (3 in that case) as shown in Figure 3. Final results can be printed directly from Clemex Vision. Raw data are linked to their respective objects for validation purpose. Raw data can also be exported in Excel format.